Empa Young Scientist Fellowship Supports Research Into Nanoscale Fractures in Thin-Film Electronics

Empa researcher Vivek Devulapalli has been awarded a two-year Empa Young Scientist Fellowship to study nanoscale failures in thin films. His project, MOSAIC, will investigate how nanometer-thin multilayer metal oxide films crack, delaminate, and deform at the atomic level.

Thin films are crucial components in modern electronic devices, including sensors, displays, capacitors, batteries, and transistors. Despite their widespread application, their mechanical behavior at the nanoscale remains poorly understood, making it difficult to diagnose failures in miniaturized electronics.

Devulapalli, a postdoctoral researcher at Empa's Laboratory for Mechanics of Materials and Nanostructures in Thun, will employ advanced microscopy techniques. These include in situ straining and 4D-STEM, allowing him to observe deformation and crack development in real time as samples are stressed.

The research will initially focus on model systems such as silicon oxide and aluminum oxide. By analyzing how composition, density, and layer thickness influence mechanical performance, the project aims to provide fundamental insights that could lead to the development of more robust thin-film electronic components.