OMRON Integrates NVIDIA Technologies into Inspection Systems
OMRON Corporation is integrating NVIDIA's Omniverse and Metropolis libraries into its inspection systems. The new technology enables visualization of component warpage and AI-driven diagnostics.
Kyoto, Japan – OMRON Corporation has announced an expansion of its collaboration with NVIDIA by integrating NVIDIA's Omniverse and Metropolis libraries into the company's automated optical inspection (AOI) and 3D-CT X-ray inspection (AXI) systems.
The integration aims to enhance the inspection process within the semiconductor industry. The new technology will enable accurate visualization of heat-induced warpage in circuit boards and facilitate AI-driven "skill-less" inspection, seeking to revolutionize the sector.
The technology combines OMRON’s automation expertise with NVIDIA’s AI and simulation technologies. It links previously siloed manufacturing data, enabling new insights and improvements in productivity and quality. OMRON is expanding the application of digital twins to inspection processes requiring micron-level precision.
Key initiatives in the collaboration include visualizing circuit board warpage through simulation, investigating hidden causal relationships by combining AOI and AXI data, and utilizing AI agents to assist in inspections. These AI agents can analyze historical data and provide straightforward explanations for complex issues, such as board warpage.
OMRON states that the new solution will help customers visualize factors affecting production, accelerate skill development for new operators, and maximize the return on investment for production lines.